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Vollmann, J., Profunser, D.M., Dual, J.:
High resolution measurement of thin metallic films and multi-layers by
femtosecond laser pulses.
Laser in Metrology and Art Conservation, Microsystems Engineering: Metrology and
Inspection, SPIE Proceedings Vol. 4400, pp. 82-89, October 2001
Abstract
This investigation deals with various new aspects of the sensitivity
improvement of a pump-probe laser based acoustic method. A short laser pulse is
used to excite a mechanical pulse thermo-elastically. Echoes of these mechanical
pulses reaching the surface are causing a slight change of the optical
reflectivity. The surface reflectivity is scanned versus time with a probe
pulse. Thus the time of flight of the acoustic pulse is measured. The quantity
to be measured i.e. the optical reflectivity change DR caused by acoustic
pulses, is rather small. A set-up having an estimated sensitivity DR/R of about
10(superscript -5 has shown to be sufficient to detect up to the 5th echo in a
50 nm aluminum film on sapphire substrate. A key challenge is the reduction of
optical and electrical cross talk between the excitation and the detection.
Therefore the concepts of double-frequency modulation, cross-polarization, and
balanced-photo-detection are implemented. Practical aspects like beam guiding,
modulation techniques, beam focus-minimization, beam focus-matching, and the
variation of the pump-probe power ratio are discussed. Measurements for single
and multi-layer metallic films demanding higher sensitivity are presented.
03/15/2002 | compiled by
Stephan Kaufmann | ZfM
| ETH
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